The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 1991

Filed:

Oct. 25, 1989
Applicant:
Inventors:

Takeshi Sugata, Hikone, JP;

Junichi Oka, Hikone, JP;

Kenji Kawai, Hikone, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359206 ; 359217 ; 359216 ;
Abstract

An optical beam scanning system is constructed with less optical elements. A light beam (B.sub.1) of parallel rays passes through a first image-forming system (L.sub.1). The first image-forming system consists of a cylindrical lens (2) having a refracting power in a direction equivalent to a main scanning direction (X) and a spherical convex lens (3). Focuses of the cylindrical lens and the spherical convex lens are within a prescribed allowance. A light beam (B.sub.11) passing through the spherical lens has a character of parallel rays within a vertical plane and a character of convergent rays within a horizontal plane to be focused on a deflection surface (4a). A reflected light beam (B.sub.2) is finally focused on a surface-to-be-scanned (8) through a second image-forming system (L.sub.2).


Find Patent Forward Citations

Loading…