The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 1991
Filed:
Jan. 17, 1991
Shein S Wang, Ponca City, OK (US);
Douglas W Hanson, Ponca City, OK (US);
Thomas D Cavanaugh, Ponca City, OK (US);
Conoco Inc., Ponca City, OK (US);
Abstract
A method for quantitatively determining an accurate subsurface velocity prior to data migration includes steps whereby the accuracy of the velocity can be defined by measuring the deviation in depth as a function of offset in the common reflection point (CRP) gather. A point on reflector is selected and the CRP gather is formed. If the image is not flat, the velocity is adjusted until it is flat. The velocity is decreased and the far offset end of the image will be imaged to shallower depth than the near offset end. The velocity is increased and the image will tilt down at the far offset end. An error is defined which is the theoretical accuracy limit for the determination of velocity using the CRP method. A factor is defined that indicates the reliability of the image for a reflector.