The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 1991

Filed:

Mar. 15, 1990
Applicant:
Inventors:

Hans van Driest, Bilthoven, NL;

Hendrik van Bokhorst, Nijkerk, NL;

Richard Kruithof, Voorschoten, NL;

Assignee:

NCR Corporation, Dayton, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K / ; H03K / ;
U.S. Cl.
CPC ...
307603 ; 307518 ; 328 55 ; 328133 ; 377 20 ; 377 56 ;
Abstract

In a delay measuring circuit (10), an input clock signal (13) is applied to a multitapped delay line (14), the output taps of which are connected to a switch (26) which selects one of the switch inputs for connection to a phase comparator (34) which compares the input clock signal (13), delayed in a delay device (38) to compensate for the delay inherent in the switch (26), with the output of the switch (26). The input clock signal is also applied to a counter (22), and when the phase comparator (34) detects a phase match, the counter value is stored in a latch (32), the counter (22) is reset to a predetermined value, and the counting procedure resumed. The latch (32) thus always stores a value dependent on the delay of an individual delay cell (16-l to 16-N). This stored value can be applied to various uses, such as in a timing watchdog circuit or for generating accurate delays.


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