The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 1991
Filed:
Apr. 04, 1990
Roland Holzl, Munich, DE;
Pruftechnik Dieter Busch+Partner GmbH & Co., Ismaning, DE;
Abstract
A method for scanning a plurality of optical measuring reflectors adapted to reflect a scan beam in a position-related manner to a position detector, which supplies signals relating to the position of the beam incidence point in the detector plane. So far a separate scan beam has been generated for each measuring reflector and there has been a separate position detector for use therewith. In accordance with the invention a single common linearly polarized scan beam L1 and a single common detector D are provided and by turning the plane of polarization of the scan beam under electronic control and by the use of further optical means the scan beam is switched over as desired to a selected measuring reflector, which then reflects the incident scan beam to the common position detector D in position-related manner.