The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 1991

Filed:

Jun. 05, 1989
Applicant:
Inventors:

Takahisa Hayashi, Kyoto, JP;

Nariaki Fujiwara, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01B / ;
U.S. Cl.
CPC ...
356319 ; 356381 ;
Abstract

A method of and an apparatus for obtaining spectral data and calculating corrected spectral data. The method includes the steps of: obtaining spectral data S'(.lambda.) which is representative of the spectral characteristics of light which is generated by a light source and reflected by an object; substantially concurrently with the step of obtaining the spectral data S'(.lambda.), obtaining spectral data R(.lambda.) which is representative of the spectral characteristics of light which is generated by the light source; and calculating corrected spectral data S(.lambda.) as a function of the spectral data S'(.lambda.) and the spectral data R(.lambda.).


Find Patent Forward Citations

Hayashi, Takahisa. (1991). Microspectroscope (U.S. Patent No. 5048960). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5048960

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