The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 1991

Filed:

Jul. 10, 1990
Applicant:
Inventors:

Fritz Berthold, 7530 Pforzheim, DE;

Willy Lohr, 7547 Wildbad, DE;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356246 ; 356244 ;
Abstract

A specimen rack composed of a block having a matrix-like arrangement of M.times.N through chambers, into which M.times.N cuvettes can be inserted, individually or in the form of strip-racks. Separate connecting strips may be provided to form the strip-racks, and these strips, like the block, are of radiopaque material so that each cuvette, except for a region defined by the lower opening cross section of the through chambers and their upper filling opening, is continuously opaquely shielded from scattering radiation from adjacent cuvettes. Annular shoulders, serving as rests, are dimensioned and disposed in the through chambers such that the vertical position and thus the assay position of the cuvettes in the through chambers can be fixed in defined fashion. Thus the measurement sensitivity on the one hand and possible crosstalk phenomena in the vicinity of the measurement openings on the other can be minimized or optimally adapted to one another.


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