The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 1991
Filed:
Apr. 11, 1990
Applicant:
Inventors:
Assignee:
Mitsubishi Rayon Company, Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382-8 ; 382 25 ;
Abstract
In a defect counting method and apparatus, a projection or a corner of a defect area is successively identified from a pixel and pixels close to the pixel, especially, from four pixel groups. The number of the defect areas is incremented when the projection is identified and decremented when the corner is identified.