The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 1991
Filed:
May. 30, 1989
Applicant:
Inventor:
Wen-Tai Lin, Schenectady, NY (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36441321 ; 36441317 ; 36441318 ;
Abstract
Parallel accumulation of the density functions of image picture elements is done for a number of elements located at the same radial distance from the axis of rotation for the fan-beam scanner. This allows the computation of weighting factor to be done in common for these elements, as well as the computation of interpolation coefficients for ray sums not registering exactly with x-ray detectors.
Lin, Wen-Tai. (1991). Parallel computation of fan-beam back-projection reconstruction (U.S. Patent No. 5047931). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5047931
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