The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 1991

Filed:

Jul. 11, 1989
Applicant:
Inventor:

Jorg Diener, Oberderdingen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356241 ; 359435 ;
Abstract

A technoscope for checking for damage, especially a crack, in a surface of a cavity in a technical component, is arranged not only to establish the area of damage but also to measure the depth of a damaged area. To this end, the technoscope has a measuring attachment comprising a measuring probe with two electrodes for straddling the damaged area, and being supported in the cavity by a support element. The depth of the damaged area is measured by means of a depth measuring instrument sensitive to the disturbance of current flow between the electrodes, and the potential difference resulting therefrom.


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Diener, Jorg. (1991). Technoscope for checking damage to surfaces (U.S. Patent No. 5046845). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5046845

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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