The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 1991

Filed:

Dec. 01, 1989
Applicant:
Inventors:

Hiroaki Andoh, Tokyo, JP;

Michio Ohshima, Tokyo, JP;

Yuji Matsui, Tokyo, JP;

Takashi Okuyama, Tokyo, JP;

Toshitaka Yoshimura, Tokyo, JP;

Hidetaka Yamaguchi, Tokyo, JP;

Yasushi Ikeda, Tokyo, JP;

Jun Nonaka, Tokyo, JP;

Tamihiro Miyoshi, Tokyo, JP;

Mitsuo Kakimoto, Tokyo, JP;

Masatoshi Iwama, Tokyo, JP;

Hideyuki Morita, Tokyo, JP;

Satoru Tachihara, Tokyo, JP;

Akira Morimoto, Tokyo, JP;

Akira Ohwaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359216 ; 250236 ; 358481 ;
Abstract

An apparatus for correcting a scranning beam produced by a polygonal mirror tilting in small surface segments in each mirror surface segment caused by uneven mirror surfaces of the polygonal mirror. Data indicative of the amount of tilting in each of the surface segments is stored in a memory, which is addressed by a data signal indicative of the present scanning position of the polygonal mirror. Output data from the memory is applied to an acousto-optical modulator disposed in the beam path between the light source and the polygonal mirror.


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