The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 1991

Filed:

Apr. 18, 1989
Applicant:
Inventors:

Masaya Kubo, Hadano, JP;

Kaoru Suzuki, Hadano, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 161 ; 371 471 ;
Abstract

In testing the fault handling function of a multi-processor system including a master processor, a slave processor, a storage control unit shared by these processors, and a service processor, the master processor and the slave processor cooperate to synchronize with each other issuing to the storage control unit successive storage access requests all designating the same storage area. The master processor also requests the service processor to generate a pseudo-fault in the above-mentioned storage area while these access requests are being successively issued in synchronism. Upon detecting a fault, the master processor collects and examines fault information, and outputs it when an abnormal result is detected.


Find Patent Forward Citations

Kubo, Masaya. (1991). Multi-processor system testing method (U.S. Patent No. 5046068). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5046068

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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