The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 1991
Filed:
Apr. 12, 1988
Naoki Tomisawa, Gunma, JP;
Yukio Hoshino, Gunma, JP;
Masashi Fukushima, Gunma, JP;
Toru Hamada, Gunma, JP;
Japan Electronic Control Systems Co., Ltd., Isezaki, JP;
Abstract
An inspection device is provided an inspection parameter generator generating predetermined parameter data. The parameter data is transmitted to a control unit subjecting inspection. The inspection device receives input signal from the control unit, which input signal corresponds to the parameter data input to the control unit. Both of the control unit and inspection device processes the corresponding data. The control unit feeds resultant output to the inspection device. The inspection device compares its own resultant data and the resultant output of the control unit to make judgment whether the control unit operates in normal condition or not.