The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 1991
Filed:
Apr. 13, 1990
Juris A Asars, Murrysville Boro, PA (US);
David Leksell, Oakmont, PA (US);
Westinghouse Electric Corp., Pittsburgh, PA (US);
Abstract
A TFEL edge emitter structure with an EL stack having a linear array of spaced-apart pixels with front edge faces emitting light of non-uniform intensity from different regions has an uniform light emission filter provided across the light-emitting faces of the pixels. The filter takes the form of an exposed photographic emulsion coated directly to the light-emitting faces of the pixels. Alternatively, the filter takes the form of a separate substrate containing the exposed photographic emulsion mounted across the light-emitting faces of the pixels. The exposed emulsion is darker at regions thereof which correspond to regions of the light-emitting edge faces of the pixels with higher original light intensity and lighter at regions thereof which correspond to regions of the light-emitting edge faces of the pixels with lower original light intensity. The final exposed emulsion reduces the original non-uniform intensity of the light from the different regions of the pixel light-emitting faces to an uniform level equal to that of the lowest original light intensity of the pixel light-emitting faces. A focussing lens can be combined with the edge emitter structure. The filter emulsion is exposed so as to compensate not only for non-uniformity of light intensity of the structure but also for optical non-uniformities of the lens.