The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 1991
Filed:
Aug. 14, 1989
Stanislaw A Lukasiewicz, Calgary, CA;
Jacek Stupnicki, Warsaw, PL;
S.A.L. Engineering and Software Ltd., Calgary, CA;
Abstract
A method and apparatus for the automatic analysis of stress in a body. The device includes a measuring head and an apparatus for traversing the measuring head across a photosensitive material attached to the body. The measuring head measures the intensity of light reflected or dispersed from the photosensitive material. The reflected or dispersed light is emitted from and received by diodes in the measuring head. Electrical signals representative of the intensity of light traversing the photosensitive material in three directions are generated for each of a set of points on the photosensitive material. The electrical signals are analyzed by computer and converted to stress and strain data which may then be displayed on a plotter or monitor. The method includes traversing the measuring head across the photosensitive material, detecting the intensity of light dispersed or reflected from the photosensitive material in three directions, analyzing the electrical signals to produce stress and strain data for the photosensitive material at each point, and displaying the resulting stress and strain data.