The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 1991
Filed:
Oct. 03, 1989
Masakatsu Iwamoto, Kagawa, JP;
Ryusyo Industrial Co., Ltd., Osaka, JP;
Abstract
An optical measuring apparatus for examining an eye which automatically aligns the optical axes of said apparatus and the eye with each other and focusing the light emitted by said apparatus on the eye. When these operations are accomplished, the projection of a measuring light is automatically started. The apparatus includes axes-aligning-focusing optical system. The optical system has a pair of optical axes-aligning light sources. Two images of beams emitted by the respective optical axes-aligning light sources and reflected by the cornea of the eye are detected by a light receiving sensor when the beams are focused substantially on the eye. Discriminating devices discriminate whether or not the optical axes of the two cornea-reflected images detected by the light receiving sensor align with the optical axis of the eye in Y-direction of the light receiving sensor. Discriminating devices discriminate whether or not the optical axes of the two cornea-reflected images detected by the light receiving sensor align with the optical axis of the eye in X-direction of the light receiving sensor. It is not until the optical axes-aligned and in-focus states are obtained that the measuring light is projected on the eye.