The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 1991
Filed:
May. 03, 1990
Hiroaki Shimozono, Tokyo, JP;
Kabushiki Kaisha TOPCON, , JP;
Abstract
A measuring apparatus has a model eye for measuring a distance from a first objective surface to a second objective surface, an observation optical system for observing an interference between reflected light flux from the model eye and reflected light flux from the object eye, and a light flux split member for splitting light flux and guiding coherent split light flux to both the object eye and the model eye. The model eye is provided with at least a first surface corresponding to the first objective surface and a second surface corresponding to the second objective surface. The interference fringe between the first surface and the first objective surface being observed, and the interference fringe between the second surface and the second objective surface is in order to measure the length of a visual line as a distance from the first objective surface to the second objective surface (eye axial length), the depth of the anterior chamber, the thickness of a crystal lens, etc.