The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 1991

Filed:

Aug. 07, 1989
Applicant:
Inventors:

Paul R Hernday, Santa Rosa, CA (US);

Roger W Wong, Santa Rosa, CA (US);

Hugo Vifian, Santa Rosa, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36457101 ; 356 731 ; 364550 ;
Abstract

A lightwave component analyzer comprising at least an internal optical receiver and preferably also comprising an internal optical source which are selectively connectable by switches configurable by means of an internal or an external instrument controller for calibration and performance of electro-optical, opto-electrical, and optical measurements. The switches are arranged in a switch matrix. The configurable switch matrix is connected by the instrument controller in response to selection of a measurement by a user to facilitate calibration of, and test measurements of devices under test with, the lightwave component analyzer.


Find Patent Forward Citations

Hernday, Paul. (1991). Lightwave component analyzer (U.S. Patent No. 5041997). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5041997

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…