The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 1991
Filed:
Aug. 18, 1989
Applicant:
Inventors:
Kazuhide Takaishi, Yamaguchi, JP;
Akira Saeki, Tokyo, JP;
Toshiki Kadonaga, Yamaguchi, JP;
Noritsugu Fujii, Yamaguchi, JP;
Assignees:
Kobe Steel, Ltd., Kobe, JP;
Eddio Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
324240 ; 324237 ; 324238 ;
Abstract
A method of nondestructively inspecting a magnetic substance such as metal pipe and bar stocks, wherein the method provides a detection coil having a diameter which is specified based on the length of existent peripheral surface flaws such that the directional sensitivity of the detection coil relative to those flaws is improved. The magnetic substance is moved along an axis thereof and has an eddy current induced therein. Relative rotation of the detection coil around the magnetic substance is effected to permit detection of surface flaws.