The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 1991
Filed:
Feb. 06, 1990
David B Chang, Tustin, CA (US);
Slava A Pollack, Palos Verdes Estate, CA (US);
Kenn S Bates, Long Beach, CA (US);
I-Fu Shih, Los Alamitos, CA (US);
Hughes Aircraft Company, Los Angeles, CA (US);
Abstract
A miniature infrared test target that comprises a heated four-bar test target operated at a high temperature and a physically separated ambient field operated at ambient temperature. A beamsplitter is disposed relative to the test target and the field in a position to combine and transmit images thereof along a common axis. A lens is disposed along the common axis and forms a combined image of the test target and the field at its image plane. Separation of the test and field targets permits miniaturization of the test target while maintaining a temperature difference between the field and the bars that is proportional to the true temperature difference. The target overcomes the difficulty of maintaining an extremely high temperature gradient in the target. It provides a greater contrast range than that provided by conventional miniature targets. The miniature infrared test target is made with surfaces approximating a blackbody, thereby providing immunity from the Narcissus problem and the effects of complicated environmental changes.