The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 1991
Filed:
Nov. 22, 1989
Shigeki Kobayashi, Shiga, JP;
Hideaki Takahara, Kyoto, JP;
Omron Corporation, Kyoto, JP;
Abstract
Disclosed is a substrate inspecting method in which light is projected to a part (21) mounted on a substrate (20) from a ring-shaped light source (29), reflected light form the surface of a soldered portion (44) is imaged by an imaging unit (32) and the nature of the soldered portion is inspected by its imaged pattern, characterized by applying fluorescent agents (70) to at least the periphery of the soldered portion of the mounted part on the surface of the substrate, exposing the surface coated with the fluorescent agents to light from the ring-shaped light source to excite the fluorescent agents, exposing the surface of the soldered portion to secondary illuminating light produced by the fluorescent agents to image its reflected light.