The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 1991
Filed:
Apr. 08, 1988
Ichiro Takahata, Kyoto, JP;
Kabushiki Kaisha Kyoto Daiichi Kagaku, Kyoto, JP;
Abstract
An apparatus for chemically analyzing a sample on a test piece that includes a reagent layer, comprises a test piece table for positioning a test piece thereon, and an applying station wherein a sample may be applied to the reagent layer. The test table moves to a position below a row of holes with the reagents aligned to the holes and a sample is applied to each reagent layer from a nozzle, the samples passing through the respective holes. Covers are moved over the holes after the samples are applied and the test pieces are moved to a measuring station for measuring the reaction between the sample and reagent layer. Photometric techniques are used in evaluating the reaction. Opening and closing of the covers is controlled by motion of the sample dispensing nozzle as it moves from one opening to the next.