The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 1991
Filed:
Mar. 31, 1989
Tadashi Uekusa, Kanagawa, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
An apparatus for measurement of optical reflection density of a surface of an article, such as a color developed analytical tape for clinical test. The apparatus comprises a support for supporting the article, a source of pulsed light and two light detectors. An optical guide directs the pulsed light to the surface of the article in a direction at an angle other than 90.degree. to the surface of the article. A light-transmissive flat plate is arranged between the optical guide and the surface of the article and may be oriented at an angle from 0.degree. to 90.degree. with the surface of the article to be measured. One of the light-detectors detects a portion of the pulsed light reflected from the surface of the light-transmissive flat plate as reference light, and the second light-detector detects a vertically reflected portion of the pulsed light diffusely reflected on the surface of the article. Light detected from the second detector may be provided for analysis after comparison with respect to the reference light of the first detector.