The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 1991
Filed:
Jul. 10, 1989
Applicant:
Inventors:
Assignee:
Kabushiki Kaisha TOPCON, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356348 ; 356347 ; 356360 ;
Abstract
An interferometer for measuring an aspherical shape uses a computer generated hologram. The interferometer comprises a hologram disposed at each of positions conjugate with plural types of aspherical surfaces to be examined and filed lens means disposed between a position conjugate with a convex aspherical surfaces and another position with a concave aspherical surface. The interferometer can measure plural types of aspherical surfaces to be examined without need of changing the position of the interferometer for each of the aspherical surfaces to be examined, even if the number of different surfaces to be examined increases.