The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 1991

Filed:

Aug. 10, 1988
Applicant:
Inventors:

Pietro P Antich, Dallas, TX (US);

James E Dowdey, Dallas, TX (US);

Robert C Murry, Jr, Dallas, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
12866001 ; 12866008 ; 73602 ;
Abstract

A method and apparatus which assesses the mechanical properties of a material by launching an ultrasound signal at the material while varying the angle of incidence and analyzing the amplitude of the ultrasound wave reflected by the material. The method and apparatus correlates extrema (maxima or minima inflection points) in the reflected angle with the angle of incidence of the transmitted signal to identify critical angles of incidence. The velocity of the pressure wave in the material has been found to be a function of a first critical angle corresponding to a first maxima as the angle of incidence is increased in the range 0.degree.-90.degree.. The velocity of the shear wave in the material has been found to be a function of a second critical angle corresponding to a second maxima following the first maxima. Young's modulus of elasticity, Poisson's modulus, and density can be approximated using the velocity of the pressure wave and shear wave for isotropic materials. A third critical angle corresponding to a minima after the first critical angle (reflected amplitude approaching o) has been found particularly useful in conjunction with the first and second critical angles in assessing bone density and in determining whether the second critical point is at a maximum or an inflection point. The extension of the method in which the plane of scattering is rotated around the normal to bone while keeping the point of observation fixed has been found particularly useful in assessing the mechanical properties of anisotropic materials such as cortical bone.


Find Patent Forward Citations

Antich, Pietro. (1991). Method and apparatus for analyzing material properties using reflected (U.S. Patent No. 5038787). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5038787

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