The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 1991

Filed:

Jul. 06, 1990
Applicant:
Inventors:

Jozef T Janssen, Eindhoven, NL;

Robert van der Ploeg, Eindhoven, NL;

Cornelis L Schuppert, Eindhoven, NL;

Adrianus A van der Vegt, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G / ; A61B / ;
U.S. Cl.
CPC ...
378197 ; 378193 ; 378196 ; 378195 ; 378-4 ;
Abstract

An x-ray examination apparatus in which an opposed x-ray source and x-ray image detector, which establish a radiation vector and an image orientation direction traverse to said vector, are mounted to be positioned relative to a series of three independently operable axes of rotation. Computing and measuring means are provided by which angular positions of rotation about the various axes can be correlated to simultaneously achieve both a desired angular orientation of the radiation vector and a desired direction of image orientation.


Find Patent Forward Citations

Janssen, Jozef. (1991). X-ray examination apparatus having three axes of rotation (U.S. Patent No. 5038371). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5038371

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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