The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 1991
Filed:
Oct. 30, 1989
Anjur S Krishnakumar, Somerville, NJ (US);
Mostafa H Sherif, Tinton Falls, NJ (US);
AT&T Bell Laboratories, Murray Hill, NJ (US);
Abstract
A method and apparatus is disclosed for determining an objective measure of performance of an extended finite state machine. Many modern complex systems, for example, computer communications protocols and computer or machine user interfaces, can be represented as extended finite state machines. A formal description of the extended finite state machine is employed to obtain a canonical form description. The canomical form description, combined with a service description, is used to generate a list of canocial state transitions transited by the extended finite state machine to perform the service. From this list, an objective measurement of performance, e.g., the time required to perform a particular service, is obtained. This objective measurement may then be used as desired, for example, to select an optimum extended finite state machine from a plurality of extended finite state machines.