The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 1991
Filed:
Mar. 20, 1989
Walter G Egan, Woodhaven, NY (US);
Grumman Aerospace Corporation, Bethpage, NY (US);
Abstract
A radiation filter structure having combined wavelength and polarization sensitive characteristics and which is constructed on a single substrate. A plurality of different wavelength (.lambda.1 to .lambda.n) interference filter coatings are applied to different areas of the filter substrate as a plurality of parallel adjacent stripes, such that different wavelengths .lambda.1 to .lambda.n are passed by the different stripe areas. Moreover, a plurality of different polarization filters of both parallel polarization or perpendicular polarization, are also applied as a plurality of parallel adjacent stripes to the different areas of the filter substrate. The arragement includes first and second interference filter stripes for each wavelength .lambda.1 to .lambda.n, and a parallel polarization filter for each first stripe for each wavelength .lambda.1 to .lambda.n, and a perpendicular polarization filter for each second stripe for each wavelength .lambda.1 to .lambda.n, such that parallel and perpendicular polarization components are passed, and can be detected, for each wavelength .lambda.1 to .lambda.n. In different disclosed embodiments the interference filter stripes and the polarization filter stripes are applied to either opposite sides or the same side of the substrate, and can extend along the length or across the width of the substrate. Moreover, the substrate can be formed by a radiation detector array, over which the interference filter stripes and the polarization filter stripes are applied.