The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 1991

Filed:

Mar. 23, 1989
Applicant:
Inventors:

Teruo Suzuki, Tokyo, JP;

Kenichi Ogawa, Tokyo, JP;

Hiroshi Murakami, Tsukuba, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C25F / ;
U.S. Cl.
CPC ...
20412935 ; 20412955 ; 20412995 ; 156664 ; 5128 / ;
Abstract

In the production of a tunneling probe tip having a sharp point by utilizing electropolishing, the present invention has enabled the production of a platinum tunneling probe tip always produceable in an identical conical form having high point sharpness without scattering in the shape caused by the anisotropy of crystal face with respect to the rate of polishing during polishing of a platinum material through adoption of a two-stage polishing process, which comprises subjecting a platinum tunneling probe tip material to a primary polishing for primary shaping of the tunneling probe tip material into a tunneling probe tip form, and then subjecting the shaped material to a secondary polishing for sharpening of the point with a mixed acid comprising sulfuric acid, nitric acid, and phosphoric acid.


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