The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 1991

Filed:

Sep. 21, 1989
Applicant:
Inventors:

John R Jungblut, Escondido, CA (US);

David A Bruno, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 731 ; 209573 ;
Abstract

The apparatus (20) includes electrically conductive contacts (44, 54) that are spaced apart a distance slightly less than the distance between the terminals (34, 36) formed on the components (24) to be tested. One contact (54) is held in position by a spring (112). The other contact (44) is stationary. The contacts (44, 54) slide against the terminal surfaces (52, 56) of the components (24) that are conveyed into a test location (26) between the contacts. The apparatus employs few moving parts and the sliding motion of the contacts (44, 54) against the terminal surfaces (52, 56) ensures that the contacts (44, 54) penetrate any oxide layer present on the terminal surfaces (52, 56). In an alternative embodiment (160), two sets of contacts (44L, 44T, 54L, 54T) are employed for testing components (24) in two adjacent test locations (26L, 26T). One configuration of a movable contact (304) is such that minimal force is applied to the terminal surfaces (52, 56) of the components (24) so that the components may be tested without marking or damaging the surfaces (52, 56).


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