The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 1991
Filed:
Jul. 14, 1989
Elliot Eichen, Arlington, MA (US);
John Schlafer, Wayland, MA (US);
William Rideout, Townsend, MA (US);
John McCabe, Londonderry, NH (US);
GTE Laboratories Incorporated, Waltham, MA (US);
Abstract
A system for measuring the frequency response of an electrooptic device, such as an optical detector, includes an optical amplifier for generating an optical white noise spectrum that is delivered to the detector. In a first embodiment, an optical amplifier or a luminescent fiber amplifier generates a white noise signal due to spontaneous-spontaneous beat noise emission, while a second embodiment utilizes the signal-spontaneous and spontaneous-spontaneous beat noise emissions generated by an optical amplifier driven by a laser source. The frequency response of the detector is determined from a measurement of the detected noise signal wherein any roll-off in the response must be due to the detector since the originally generated noise spectrum is flat.