The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 1991

Filed:

Feb. 22, 1990
Applicant:
Inventors:

Kazuaki Ohkubo, Takatsuki, JP;

Yoshihiro Ohno, Ibaraki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01J / ; G01J / ;
U.S. Cl.
CPC ...
250372 ; 2502521 ;
Abstract

A method and apparatus for measuring a single-wavelength irradiance employ (1) a reference photosensor unit combining a photodiode having an absolute response at a given wavelength calibrated by a self-calibration process and a precision aperture, (2) a single radiation source of the given wavelength combining a band-pass filter having a pass band only near the given wavelength and a radiation source for producing a line spectrum radiation of the given wavelength, and (3) a radiation illuminometer. The reference photosensor unit is arranged at a distance d from the single radiation source to measure the irradiance thereat, and then the radiation illuminometer is arranged at the position of the reference photosensor unit to calibrate an indicating scale of the radiation illuminometer with respect to the single radiation of the given wavelength in relation with the reference photosensor unit.


Find Patent Forward Citations

Loading…