The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 1991
Filed:
Jun. 20, 1990
Ulrich Boesl, Landshut, DE;
Edward W Schlag, Munich, DE;
Klaus Walter, Weilheim, DE;
Rainer Weinkauf, Munchen, DE;
Bruker Franzen Analytik GmbH, , DE;
Abstract
In an MS-MS time-of-flight mass spectrometer, a space focus of the ion source is defined by correction of the second order. If the geometrical and electric values of the ion source are suitably selected, the space focus may be such as to permit very good primary mass resolution when suitable secondary interaction methods are used. The secondary interaction at the space focus may be effected (a) by a focused, pulsed laser ray or other pulsed interaction methods that can be focused. (b) by a wire mesh consisting of very fine 'line combs' engaging each other, to which voltage pulses can be applied, (c) by a combination of a) and/or b) with an electrostatically high, primary, fieldless drift path. The MS-MS time-of-flight mass spectrometer is operated using a reflector comprising a movable reflector end plate with adjustable potential, which enables primary ions to be eliminated from the spectrum without any loss in mass resolution. By tuning the reflector fields in a suitable manner, and suitable selection of an observation window in the time-of-flight spectrum, it is possible to measure a secondary mass spectrum generated at the space focus.