Mos semiconductor memory device having sense control circuitry simplified

Abstract

An MOS semiconductor memory device includes memory cell matrices. Each matrix is constituted with memory cells and noise cancellers. Each memory cell is connected, at an intersection between a pair of bit lines and a word line, between either one of the bit lines and the word line. The word line controls read and write operations of the memory cell. The noise canceller is connected, at an intersection between a pair of bit lines and a dummy word line, between either one of the bit lines and the dummy word line. The dummy word line enables the noise canceller. The memory cell matrices form groups of memory cells into which the cells are grouped in accordance wtih addresses. The dummy word line and the word line have substantially identical characteristics. The dummy word line possesses parasitic resistance and capacitance to delay by a first predetermined period of time a signal to enable the noise canceller. The memory device further includes sense amplifier circuits connected between the pair of bit lines of the memory cell matrices for amplifying a potential difference between the bit lines in response to an enable signal, and a sense control circuit connected to the dummy word lines and the sense amplifier circuits to be operative in a read or write operation of the memory cell for selectively enabling related sense amplifier circuits in response to a signal delayed by a dummy word line of selected ones of the memory cell matrices.