The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 1991
Filed:
Oct. 13, 1989
Applicant:
Inventor:
Takashi Nakamura, Aichi, JP;
Assignee:
Sumitomo Electric Industries, Ltd., Osaka, JP;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23Q / ;
U.S. Cl.
CPC ...
324721 ; 73104 ; 324451 ;
Abstract
A method for detecting wear of a cutting tool for cutting a workpiece measures the contact resistance between the cutting tool and the workpiece for detecting wear of the cutting tool from a change in the contact resistance, whereby such wear of the cutting tool can be reliably and accurately measured.
Nakamura, Takashi. (1991). Method of detecting wear of cutting tool by ascertaining a tool (U.S. Patent No. 5030920). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5030920
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile