The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 1991
Filed:
Jan. 09, 1990
Applicant:
Inventors:
Akihiro Inde, Toride, JP;
Hiromitsu Ebihara, Toride, JP;
Assignee:
Komori Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250559 ; 356443 ;
Abstract
Light received by a light receiving element in a quality inspection device for printed matter, is controlled to a constant value by passing the received light through a graduated neutral density filter that is adjusted in position relative to the optical axis of the light receiving element in dependence on the feed speed of the printed matter.
Inde, Akihiro. (1991). Quality inspection device for printed matter and method thereof (U.S. Patent No. 5030838). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5030838
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