The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 1991
Filed:
May. 31, 1989
Walter G Egan, Woodhaven, NY (US);
Grumman Aerospace Corporation, Bethpage, NY (US);
Abstract
A system for detecting and analyzing polarized radiation incident with a skewed polarization plane while utilizing radiation filter structures having combined wavelength and polarization sensitive characteristics. The system includes first and second radiation filters each of which comprises a plurality of different wavelength .lambda.l to .lambda.n interference filter coatings applied to a filter substrate as a plurality of parallel adjacent stripes, such that different wavelengths .lambda.l to .lambda.n are passed by the different stripes. Moreover, a plurality of different polarization filters of either parallel polarization or perpendicular polarization, are also applied as a plurality of parallel adjacent stripes to the different areas of the filter substrate. The arrangement includes first and second interference filter stripes for each wavelength .lambda.l to .lambda.n, a parallel polarization filter for each wavelength .lambda.l to .lambda.n, and a perpendicular polarization filter for each wavelength .lambda.l to .lambda.n, such that parallel and perpendicular polarization components are passed, and can be detected, for each wavelength .lambda.l to .lambda.n. A complete detection and analysis of the polarization characteristics of the radiation is achieved by orienting the first radiation filter with its parallel and perpendicular axes of polarization positioned at a 45.degree. acute angle relative to respectively the parallel and perpendicular axes of polarization of the second filter, such that radiation incident on the first and second radiation filters with a skewed polarization plane can be detected and analyzed with respect to its state of polarization.