The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 1991

Filed:

Aug. 14, 1989
Applicant:
Inventors:

Gustav Gautschi, Zurich, CH;

Peter Wolfer, Kleinandelfingen, CH;

Denis Kohler, Neftenbach, CH;

Assignee:

Kistler Instrumente A.G., Winterthur, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L / ;
U.S. Cl.
CPC ...
7386204 ; 73172 ;
Abstract

A measuring platform having at least one force transducer rigidly fixed to either the base or cover element and to the other of the base or cover element movably to minimize measuring errors due to bending of the cover element under forces to be measured.


Find Patent Forward Citations

Gautschi, Gustav. (1991). Measuring platform (U.S. Patent No. 5029483). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5029483

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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