The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 1991
Filed:
Jul. 19, 1990
Jurgen Wulf, Uberlingen, DE;
Werner Lahmann, Uberlingen, DE;
Bodenseewerk Perkin Elmer GmbH, Uberlingen, DE;
Abstract
In a double-beam photometer comprising a light source providing a light beam, detector means, a sample area, optical means for guiding the light beam as a measuring light beam through the sample area onto the detector means, means for guiding the same light beam as a reference light beam onto the detector means while avoiding the sample area, and chopper means disposed in a splitting location for splitting the light beam into the measuring light beam, which are combined into one path of rays in a recombination location, after the measuring light beam has passed through the sample area, with the splitting location and the recombination location being spatially close to each other. The chopper means has a single chopper which simultaneously effects the splitting and the combination of the measuring and reference light beams.