The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 1991
Filed:
Jun. 15, 1989
A Reed Valleau, Newton, MA (US);
Thomas A Gross, Lincoln, MA (US);
Trustees of the Thomas A. D. Gross 1988 Revocable Trust, Lincoln, MA (US);
Abstract
Several phenomena which occur commonly in graphite composites, as well as other materials, and which affect the impedance of an eddy-current probe have been characterized on the complex impedance plane. An eddy-current method is disclosed by which a target material is stimulated at several frequencies, the impedance of the probe is measured and compared to the impedance of reference material, and the condition of the target material is determined. The method described is capable of finding the signatures of a number of conditions commonly found by eddy-currents, and can be programmed to find others, such as conductive and non-conductive plating thicknesses, and inclusions of material with relative ferrous materials. Because the method determines faults on the normalized impedance plane, it is capable of being used on other conductive materials in addition to graphite composites. A unique technique for accurately describining the size and shape of a fault with improved resolution using nondestructive eddy-current testing is also disclosed by which faults found by two anisotropic scans of the same material are mathematically combined.