The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 1991

Filed:

Apr. 17, 1989
Applicant:
Inventors:

Najmi T Jarwala, Plainsboro, NJ (US);

Chi W Yau, Holland, PA (US);

Assignee:

AT&T Bell Laboratories, Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 27 ;
Abstract

A set of test vectors for input to a circuit (10) to test the integrity of each of its n interconnections (nets) 16 is generated by first ordering the nets. Thereafter, the vectors are generated by assigning the bits of each vector associated with a given net a one or zero such that the vector has a minimum weight, as compared to the vectors assigned to successive nets. Alternatively, the test vectors can be generated by assigning the bits of selected groups of vectors a one or zero such that the groups of vectors each have minimum potential weight and the vectors in the group are independent of each other. The successive groups of vectors are then concatenated to yield the test vector set.


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