The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 1991
Filed:
Apr. 19, 1989
Applicant:
Inventor:
Stephen C Cripps, Sunnyvale, CA (US);
Assignee:
Celeritek, Inc., San Jose, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 715 ; 3241 / ;
Abstract
The operating temperature of the active region of an RF semiconductor device such as a microwave hybrid circuit having a gallium arsenide field-effect transistor therein is determined by measuring signal gain of the device at variable times following application of bias voltage to the device. Bias voltage is applied in response to a constant duty cycle pulse train from which are derived a sample-and-hold command pulse and a synchronized bias control pulse.
Cripps, Stephen. (1991). Method and means for measuring operating temperature of semiconductor (U.S. Patent No. 5027064). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5027064
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile