The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 1991

Filed:

Jan. 10, 1990
Applicant:
Inventors:

John N Lee, Silver Spring, MD (US);

Carl M Verber, Atlanta, GA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 350 9611 ;
Abstract

An improved compact optical and rugged laser-driven RF spectrum analyzer ng made up of slab-like waveguide means. The waveguide means has at one end enhanced surface diffraction grating means for intercepting and selectively diffracting a laser source beam so that the diffracted laser beam is deflected, expanded and focussed to converge toward the other end and in relation to both a surface acoustic wave (SAW) and detector array means. The waveguide means includes novel combined signal detection and arcuate-shaped transducer (CSD/AT) means between its ends for forming and directing the SAW in response to a detected RF (microwave) signal to be analyzed such that the SAW optically intercepts, interacts and further diffracts in Bragg-Cell-like fashion that converging beam so as to deflect same relative to detector array means at the other end of the waveguide means. The detector array means normally analyzes a series of differently deflected beams so as to provide frequency distribution and intensity of one or more detected signals. A second surface diffraction grating means can be provided on the waveguide means and interposed between the first surface diffraction grating means and the CSD/AT means so as to compensate for aberrations in the converging beam that might otherwise interfere with the detector array means analysis of an optically diffracted source beams.


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