The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 1991
Filed:
Oct. 03, 1989
Richard Stroman, Davis, CA (US);
Other;
Abstract
A method and apparatus for non-destructive internal and external inspection of produce, including the detection of pits in various stone fruits. The apparatus transmits a first plurality of beams of light (20) across inspection zone (14) and transmits a second plurality of beams of light (30) across inspection zone (14) in a direction transverse to beams of light (20), thus forming an X-Y plane. As article of produce (10) passes through inspection zone (14) along the Z-axis, a first plurality of sensors (24) and a second plurality of sensors (34) detect the variations in the intensity of the beams of light and the data is processed to produce a three-dimensional 'picture' of the article of produce. Size, symmetry, external defects, and internal structure are determined as a result of processing the data collected. The apparatus and method can be used for detecting pits or surface defects, and for sorting or rejecting articles of produce based on size, symmetry, external defects or internal structure.