The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 1991
Filed:
Mar. 05, 1990
Applicant:
Inventors:
Angel L Ortiz, Jr, Scotia, NY (US);
John L Schneiter, Latham, NY (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250205 ; 25022711 ; 21912183 ;
Abstract
A laser materials processing apparatus including means for optically monitoring the processing and generating a processing signal representative of the processing, means for interpreting the processing signal and generating an interpreted output, and means for controlling the materials processing based upon the interpreted output and by generating a control signal applied to a laser materials processing component.
Ortiz, Jr, Angel. (1991). Method and apparatus for optically monitoring laser materials processing (U.S. Patent No. 5026979). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5026979
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile