The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 1991

Filed:

Dec. 04, 1989
Applicant:
Inventor:

George Hayashi, San Jose, CA (US);

Assignee:

Swift Instruments, Inc., Boston, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
350518 ; 350521 ; 350522 ;
Abstract

A microscope has a microscope stand with a specimen stage for viewing and a microscope tube mounted on the stand, the tube having an eyepiece at one end and an objective at the other end, adjacent the stage. The tube is constructed for axial adjustment to vary the position of the objective relative to a specimen on the stage, both by application of axially directed force for coarse focus adjustment and by application of rotational force for fine focus adjustment.


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