The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 1991

Filed:

Dec. 12, 1988
Applicant:
Inventors:

Jun Kubota, Hitachi, US;

Hirotoshi Kino, Hitachi, US;

Yosinori Musha, Hitachiota, US;

Hisao Okada, Hitachi, US;

Assignee:

Hitaci, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73634 ; 73620 ;
Abstract

In a system for irradiating an ultrasonic beam and imaging the insides of plate-shaped and layer-shaped samples, by using the difference between the sound velocities of a liquid medium and a sample from an ultrasonic transducer to the surface of the sample, the focusing condition is arithmetically operated from the distance between the transducer and the imaging surface which is obtained from the surface echo, and a focal point is set to an arbitrary surface in the sample, thereby correcting a phenomenon such that the focal point of the ultrasonic beam focused into the sample non-linearly moves. Thus, even if the sample is distorted, curved, or inclined, the surface can be imaged at a high resolution and a finer imaging picture can be obtained.


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