The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 1991
Filed:
Mar. 02, 1990
Souji Sasaki, Hitachi, JP;
Hirotoshi Kino, Hitachi, JP;
Yoshinori Musha, Hitachiota, JP;
Jun Kubota, Hitachi, JP;
Hisao Okada, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A fan-shaped scanning flaw detecting apparatus which includes a probe provided with an ultrasonic wave transmitting-and-receiving array transducer arranged along a circular arc and an acoustic lens for converging and converting an ultrasonic beam transmitted/received by the array transducer into a substantially parallel beam. The apparatus also includes a scanning function section that sequentially switches the transmitting and receiving operation of a group of operative transducer elements of the array transducer so as to make the ultrasonic beam perform fan-shaped scanning. A picturizing processor section forms a sectional image of an object to be examined on the basis of an echo signal obtained from the object to be examined and a display section displays the sectional image. A position detecting section detects a position where the ultrasonic beam is incident to the object to be examined when the probe is moved along a surface of the object to be examined. Image information of a sectional image of the object to be examined under a running path of the probe is formed by the picturizing processor section on the basis of two types of information, a first type representing the position of the ultrasonic beam incident to the object to be examined, which is obtained from the position detecting section, and a second type of information representing a position and relection intensity of the reflection source inside the object to the be examined, which is obtained on the basis of a reflection signal of a transmitted ultrasonic pulse reflected by the reflection source. The sectional image information is then read and displayed by the display section.