The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 1991
Filed:
Oct. 31, 1988
Roger M Crane, Arnold, MD (US);
Eugene C Fischer, Stevensville, MD (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A method and apparatus for the two dimensional measurement of displacements of sample materials using a photodetector grid array and optical fiber embedded in the test specimen. The system consists of a light source which is passed into one end of an optical fiber which has been embedded a beam specimen, so that when the beam is placed in motion, the light traverses through the fiber and emerges from the opposite end where its projected image traces a pattern simulating that of the beam. In a preferred embodiment, the collimated exiting light is incident upon a light beam splitter which directs equal portions of the light toward a quadrant photovoltaic cell device and toward a charge couple device (CCD). The CCD is connected to an optoelectronic viewing device for initial calibration, display and monitoring. The photodetector array is connected to a translator/amplifier which increases the photocells' source currents and converts them to equivalent voltages for output to a digital data processing terminal. The processing terminal integrates all simultaneous measurements by vectorial resolution of the voltage related deflections' magnitude and direction.