The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 1991
Filed:
Jun. 29, 1989
Roy C Stroud, Richmond, VA (US);
Walter A Baker, Richmond, VA (US);
Other;
Abstract
An apparatus for optically inspecting printer die motifs, with the inspection including measuring the length, width, and depth of motifs, and measuring the circumferential separation of two motifs when more than one motif is disposed on the same printer die, the apparatus includes microscope optics supported by a stand, a table for supporting a precision divider head upon which the printer die carrying the motif is mounted, with the table being movable in an 'X' and 'Y' direction in a plane perpendicular to the axis of the optical path issuing from the optics, the precision divider head for rotating the printer die motif through the optical path of the optics, a first digital micrometer to measure length of a motif, a second digital micrometer to measure the width of a motif, a dial indicator to measure the depth of a motif, and the rotational indicator to measure the circumferential separation of two motifs on the same printer die.