The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 1991

Filed:

Jul. 14, 1989
Applicant:
Inventors:

Hisafumi Motoe, Tokyo, JP;

Hiroyuki Kawashima, Tokyo, JP;

Masaharu Tokuhara, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ; H04N / ;
U.S. Cl.
CPC ...
358 11 ; 358140 ;
Abstract

Interpolated scan lines are produced in response to received video signals which are comprised of conventional interlaced scan lines constituting successive fields. A delay circuit, preferably formed of field memory devices, such as three cascaded field memories, functions to delay the received video signals to provide a first scanned line signal in a given field, the next succeeding scan line signal in that field, an interlaced scan line signal in the next succeeding field and an interlaced scan line signal in the next preceding field. A first combining circuit combines the signal values of the next succeeding field interlaced scan line signal and the next preceding field interlaced scan line signal to form a first combined scan line signal. A second combining circuit combines the signal values of the first scan line signal in the given field and the next succeeding scan line signal in that field to form a second combined scan line signal. The first and second combined scan line signals are level adjusted and added to produce an interpolated scan line signal intermediate successive main scan lines in the given field.


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